Pinpoint Tests

PINPOINT TEST A: DTCS B106E/B106F - SOLID STATE DRIVER DISABLED/MODULE DISABLED

Normal Operation
When a repetitive fault causing a circuit overload is detected on certain output circuits, the smart junction box (SJB)/GEM disables the circuit by removing voltage, or ground, to the affected circuit. The circuit remains disabled until the fault is corrected and an on-demand self-test is run. When the on-demand self-test has been run after all faults have been corrected, any DTCs related to the fault are cleared.

DTC B106E (Solid State Driver Disabled Due to Short Circuit) - sets when the SJB/GEM has disabled a circuit due to a repetitive fault causing a circuit overload. For a complete list of corresponding DTCs, refer to Principles of Operation. Principles of Operation

DTC B106F (Module Disabled Due to External Fault) - sets when one or more output functions are permanently disabled due to a repetitive circuit overload fault. When DTC B106F is present, the SJB/GEM must be replaced after the fault condition has been corrected.

Possible Causes
- Output circuit short to ground or voltage
- SJB/GEM

A1-A2:

A3: