Tests AE: DTC B106E - Solid State Driver Disabled Due To Short Circuit
PINPOINT TEST AE: DTC B106E - SOLID STATE DRIVER DISABLED DUE TO SHORT CIRCUITNormal Operation
The instrument cluster (IC) controls the output for the traction control/stability assist disable lamp, accessory delay, battery saver and illuminated entry features. When a repetitive fault causing a circuit overload is detected on the output circuit, the instrument cluster (IC) disables the circuit by removing the ground to the affected circuit. The circuit remains disabled until the fault is corrected.
DTC B106E is set in continuous memory in the instrument cluster (IC) when the instrument cluster (IC) has disabled a circuit due to a repetitive fault causing a circuit overload. A corresponding DTC for the circuit in question also sets as follows:
- DTC B1304 - Accessory Delay Relay Coil Circuit Short to Battery
- DTC B1315 - Battery Saver Relay Coil Circuit Short to Battery
- DTC B1373 - Illuminated Entry Relay Short to Battery
- DTC C1105 - Traction Control Disable Lamp Circuit Short to Battery
This pinpoint test is intended to diagnose the following:
- Wiring, terminals or connectors
- Instrument cluster (IC)
